ScatteringScatteringLseriesOpticalpathSequentialspectrometersWavelengthReferencematerialWD-XRFLimit ofDetectionOpticsLoss ofignition(LOI)SpectrumMonochromatorWe areat slide22MultichannelanalyzerBeadsTable topinstrumentSensitivitySpecimenQuantitativeanalysisCountspersecondPelletSpinnerSi-PINMoseley’slawDiffractioncrystalThere is aspellingmistake onthe slideResolutionNormalizationDetectorSomeonesneezesPowderPpmSensitivityPolarizationWe get tolook up atableL-shellTin(Sn)SamplepreparationWe areat slide48SomeonesneezesRhodium(Rh)AnalysisVacancyM-shellSignaltonoiseVacuumSiegbahnnotationWe get todo acalculationChemometricCupConcentrationWavelengthdispersiveSequentialXRFCalibrationComptonPANanlyticalRadiationWe get todo anexperimentDataprocessingSamplepreparationAugerSiegbahnnotationBragg’slawX-raySignaltonoiseMatrixeffectAnalyzingcrystalAbsorptionedgeSequentialXRFCompoundX-raytubeQualitativeanalysisPeakareaDispersionReproducibilityMACRayleighAbsorptionStandarddeviationAccuracyBindingenergyBremsstrahlungCollimeterSpectrallineLimit ofQuantitationMalvernSpectrometerMetalSi-PINSequentialspectrometersLecturerpassesaroundsamplesScatteringScatteringLseriesOpticalpathSequentialspectrometersWavelengthReferencematerialWD-XRFLimit ofDetectionOpticsLoss ofignition(LOI)SpectrumMonochromatorWe areat slide22MultichannelanalyzerBeadsTable topinstrumentSensitivitySpecimenQuantitativeanalysisCountspersecondPelletSpinnerSi-PINMoseley’slawDiffractioncrystalThere is aspellingmistake onthe slideResolutionNormalizationDetectorSomeonesneezesPowderPpmSensitivityPolarizationWe get tolook up atableL-shellTin(Sn)SamplepreparationWe areat slide48SomeonesneezesRhodium(Rh)AnalysisVacancyM-shellSignaltonoiseVacuumSiegbahnnotationWe get todo acalculationChemometricCupConcentrationWavelengthdispersiveSequentialXRFCalibrationComptonPANanlyticalRadiationWe get todo anexperimentDataprocessingSamplepreparationAugerSiegbahnnotationBragg’slawX-raySignaltonoiseMatrixeffectAnalyzingcrystalAbsorptionedgeSequentialXRFCompoundX-raytubeQualitativeanalysisPeakareaDispersionReproducibilityMACRayleighAbsorptionStandarddeviationAccuracyBindingenergyBremsstrahlungCollimeterSpectrallineLimit ofQuantitationMalvernSpectrometerMetalSi-PINSequentialspectrometersLecturerpassesaroundsamples

Malvern PANalytical - Call List

(Print) Use this randomly generated list as your call list when playing the game. There is no need to say the BINGO column name. Place some kind of mark (like an X, a checkmark, a dot, tally mark, etc) on each cell as you announce it, to keep track. You can also cut out each item, place them in a bag and pull words from the bag.


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  1. Scattering
  2. Scattering
  3. L series
  4. Optical path
  5. Sequential spectrometers
  6. Wavelength
  7. Reference material
  8. WD-XRF
  9. Limit of Detection
  10. Optics
  11. Loss of ignition (LOI)
  12. Spectrum
  13. Monochromator
  14. We are at slide 22
  15. Multichannel analyzer
  16. Beads
  17. Table top instrument
  18. Sensitivity
  19. Specimen
  20. Quantitative analysis
  21. Counts per second
  22. Pellet
  23. Spinner
  24. Si-PIN
  25. Moseley’s law
  26. Diffraction crystal
  27. There is a spelling mistake on the slide
  28. Resolution
  29. Normalization
  30. Detector
  31. Someone sneezes
  32. Powder
  33. Ppm
  34. Sensitivity
  35. Polarization
  36. We get to look up a table
  37. L-shell
  38. Tin (Sn)
  39. Sample preparation
  40. We are at slide 48
  41. Someone sneezes
  42. Rhodium (Rh)
  43. Analysis
  44. Vacancy
  45. M-shell
  46. Signal to noise
  47. Vacuum
  48. Siegbahn notation
  49. We get to do a calculation
  50. Chemometric
  51. Cup
  52. Concentration
  53. Wavelength dispersive
  54. Sequential XRF
  55. Calibration
  56. Compton
  57. PANanlytical
  58. Radiation
  59. We get to do an experiment
  60. Data processing
  61. Sample preparation
  62. Auger
  63. Siegbahn notation
  64. Bragg’s law
  65. X-ray
  66. Signal to noise
  67. Matrix effect
  68. Analyzing crystal
  69. Absorption edge
  70. Sequential XRF
  71. Compound
  72. X-ray tube
  73. Qualitative analysis
  74. Peak area
  75. Dispersion
  76. Reproducibility
  77. MAC
  78. Rayleigh
  79. Absorption
  80. Standard deviation
  81. Accuracy
  82. Binding energy
  83. Bremsstrahlung
  84. Collimeter
  85. Spectral line
  86. Limit of Quantitation
  87. Malvern
  88. Spectrometer
  89. Metal
  90. Si-PIN
  91. Sequential spectrometers
  92. Lecturer passes around samples