There is aspellingmistake onthe slideWe areat slide22SamplepreparationReproducibilityStandarddeviationMACSi-PINWavelengthWavelengthdispersiveSamplepreparationSignaltonoiseAccuracyRadiationSiegbahnnotationPpmX-raytubeSomeonesneezesRayleighAnalysisDataprocessingMetalWe get todo anexperimentWD-XRFPelletBindingenergyQuantitativeanalysisMonochromatorVacancyTin(Sn)PANanlyticalDiffractioncrystalWe get tolook up atableSequentialspectrometersDispersionConcentrationLecturerpassesaroundsamplesNormalizationSequentialspectrometersRhodium(Rh)SiegbahnnotationCountspersecondSignaltonoiseWe areat slide48X-rayLoss ofignition(LOI)CollimeterSpectrumL-shellChemometricPolarizationCupOpticalpathScatteringMatrixeffectLimit ofQuantitationSomeonesneezesSpectrometerMoseley’slawM-shellSpectrallineBragg’slawOpticsLimit ofDetectionBeadsPeakareaLseriesTable topinstrumentSensitivityCalibrationVacuumCompoundReferencematerialComptonSequentialXRFSi-PINSpecimenMultichannelanalyzerQualitativeanalysisSpinnerDetectorAbsorptionAnalyzingcrystalPowderSensitivityAbsorptionedgeSequentialXRFResolutionWe get todo acalculationBremsstrahlungScatteringAugerMalvernThere is aspellingmistake onthe slideWe areat slide22SamplepreparationReproducibilityStandarddeviationMACSi-PINWavelengthWavelengthdispersiveSamplepreparationSignaltonoiseAccuracyRadiationSiegbahnnotationPpmX-raytubeSomeonesneezesRayleighAnalysisDataprocessingMetalWe get todo anexperimentWD-XRFPelletBindingenergyQuantitativeanalysisMonochromatorVacancyTin(Sn)PANanlyticalDiffractioncrystalWe get tolook up atableSequentialspectrometersDispersionConcentrationLecturerpassesaroundsamplesNormalizationSequentialspectrometersRhodium(Rh)SiegbahnnotationCountspersecondSignaltonoiseWe areat slide48X-rayLoss ofignition(LOI)CollimeterSpectrumL-shellChemometricPolarizationCupOpticalpathScatteringMatrixeffectLimit ofQuantitationSomeonesneezesSpectrometerMoseley’slawM-shellSpectrallineBragg’slawOpticsLimit ofDetectionBeadsPeakareaLseriesTable topinstrumentSensitivityCalibrationVacuumCompoundReferencematerialComptonSequentialXRFSi-PINSpecimenMultichannelanalyzerQualitativeanalysisSpinnerDetectorAbsorptionAnalyzingcrystalPowderSensitivityAbsorptionedgeSequentialXRFResolutionWe get todo acalculationBremsstrahlungScatteringAugerMalvern

Malvern PANalytical - Call List

(Print) Use this randomly generated list as your call list when playing the game. There is no need to say the BINGO column name. Place some kind of mark (like an X, a checkmark, a dot, tally mark, etc) on each cell as you announce it, to keep track. You can also cut out each item, place them in a bag and pull words from the bag.


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  1. There is a spelling mistake on the slide
  2. We are at slide 22
  3. Sample preparation
  4. Reproducibility
  5. Standard deviation
  6. MAC
  7. Si-PIN
  8. Wavelength
  9. Wavelength dispersive
  10. Sample preparation
  11. Signal to noise
  12. Accuracy
  13. Radiation
  14. Siegbahn notation
  15. Ppm
  16. X-ray tube
  17. Someone sneezes
  18. Rayleigh
  19. Analysis
  20. Data processing
  21. Metal
  22. We get to do an experiment
  23. WD-XRF
  24. Pellet
  25. Binding energy
  26. Quantitative analysis
  27. Monochromator
  28. Vacancy
  29. Tin (Sn)
  30. PANanlytical
  31. Diffraction crystal
  32. We get to look up a table
  33. Sequential spectrometers
  34. Dispersion
  35. Concentration
  36. Lecturer passes around samples
  37. Normalization
  38. Sequential spectrometers
  39. Rhodium (Rh)
  40. Siegbahn notation
  41. Counts per second
  42. Signal to noise
  43. We are at slide 48
  44. X-ray
  45. Loss of ignition (LOI)
  46. Collimeter
  47. Spectrum
  48. L-shell
  49. Chemometric
  50. Polarization
  51. Cup
  52. Optical path
  53. Scattering
  54. Matrix effect
  55. Limit of Quantitation
  56. Someone sneezes
  57. Spectrometer
  58. Moseley’s law
  59. M-shell
  60. Spectral line
  61. Bragg’s law
  62. Optics
  63. Limit of Detection
  64. Beads
  65. Peak area
  66. L series
  67. Table top instrument
  68. Sensitivity
  69. Calibration
  70. Vacuum
  71. Compound
  72. Reference material
  73. Compton
  74. Sequential XRF
  75. Si-PIN
  76. Specimen
  77. Multichannel analyzer
  78. Qualitative analysis
  79. Spinner
  80. Detector
  81. Absorption
  82. Analyzing crystal
  83. Powder
  84. Sensitivity
  85. Absorption edge
  86. Sequential XRF
  87. Resolution
  88. We get to do a calculation
  89. Bremsstrahlung
  90. Scattering
  91. Auger
  92. Malvern