StandarddeviationWe get todo acalculationRhodium(Rh)X-rayLoss ofignition(LOI)Tin(Sn)SamplepreparationLimit ofQuantitationMalvernTable topinstrumentM-shellQuantitativeanalysisSi-PINConcentrationAnalysisSomeonesneezesWe get todo anexperimentMetalSomeonesneezesSpecimenScatteringAbsorptionSequentialXRFThere is aspellingmistake onthe slideDispersionDiffractioncrystalBindingenergyLimit ofDetectionWe areat slide48AnalyzingcrystalDetectorPpmCupSequentialspectrometersMoseley’slawComptonRayleighSpectrometerQualitativeanalysisPolarizationChemometricSensitivitySpectrallinePANanlyticalSiegbahnnotationSequentialXRFSi-PINPowderAugerSiegbahnnotationReproducibilityNormalizationSignaltonoiseWe get tolook up atableSamplepreparationAccuracyCountspersecondResolutionDataprocessingBremsstrahlungSpinnerLseriesBeadsOpticalpathSignaltonoiseAbsorptionedgeSpectrumVacancyPelletWavelengthdispersiveOpticsSequentialspectrometersL-shellCompoundRadiationX-raytubeLecturerpassesaroundsamplesMonochromatorMatrixeffectCollimeterMACWD-XRFSensitivityCalibrationMultichannelanalyzerPeakareaScatteringWe areat slide22VacuumWavelengthBragg’slawReferencematerialStandarddeviationWe get todo acalculationRhodium(Rh)X-rayLoss ofignition(LOI)Tin(Sn)SamplepreparationLimit ofQuantitationMalvernTable topinstrumentM-shellQuantitativeanalysisSi-PINConcentrationAnalysisSomeonesneezesWe get todo anexperimentMetalSomeonesneezesSpecimenScatteringAbsorptionSequentialXRFThere is aspellingmistake onthe slideDispersionDiffractioncrystalBindingenergyLimit ofDetectionWe areat slide48AnalyzingcrystalDetectorPpmCupSequentialspectrometersMoseley’slawComptonRayleighSpectrometerQualitativeanalysisPolarizationChemometricSensitivitySpectrallinePANanlyticalSiegbahnnotationSequentialXRFSi-PINPowderAugerSiegbahnnotationReproducibilityNormalizationSignaltonoiseWe get tolook up atableSamplepreparationAccuracyCountspersecondResolutionDataprocessingBremsstrahlungSpinnerLseriesBeadsOpticalpathSignaltonoiseAbsorptionedgeSpectrumVacancyPelletWavelengthdispersiveOpticsSequentialspectrometersL-shellCompoundRadiationX-raytubeLecturerpassesaroundsamplesMonochromatorMatrixeffectCollimeterMACWD-XRFSensitivityCalibrationMultichannelanalyzerPeakareaScatteringWe areat slide22VacuumWavelengthBragg’slawReferencematerial

Malvern PANalytical - Call List

(Print) Use this randomly generated list as your call list when playing the game. There is no need to say the BINGO column name. Place some kind of mark (like an X, a checkmark, a dot, tally mark, etc) on each cell as you announce it, to keep track. You can also cut out each item, place them in a bag and pull words from the bag.


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  1. Standard deviation
  2. We get to do a calculation
  3. Rhodium (Rh)
  4. X-ray
  5. Loss of ignition (LOI)
  6. Tin (Sn)
  7. Sample preparation
  8. Limit of Quantitation
  9. Malvern
  10. Table top instrument
  11. M-shell
  12. Quantitative analysis
  13. Si-PIN
  14. Concentration
  15. Analysis
  16. Someone sneezes
  17. We get to do an experiment
  18. Metal
  19. Someone sneezes
  20. Specimen
  21. Scattering
  22. Absorption
  23. Sequential XRF
  24. There is a spelling mistake on the slide
  25. Dispersion
  26. Diffraction crystal
  27. Binding energy
  28. Limit of Detection
  29. We are at slide 48
  30. Analyzing crystal
  31. Detector
  32. Ppm
  33. Cup
  34. Sequential spectrometers
  35. Moseley’s law
  36. Compton
  37. Rayleigh
  38. Spectrometer
  39. Qualitative analysis
  40. Polarization
  41. Chemometric
  42. Sensitivity
  43. Spectral line
  44. PANanlytical
  45. Siegbahn notation
  46. Sequential XRF
  47. Si-PIN
  48. Powder
  49. Auger
  50. Siegbahn notation
  51. Reproducibility
  52. Normalization
  53. Signal to noise
  54. We get to look up a table
  55. Sample preparation
  56. Accuracy
  57. Counts per second
  58. Resolution
  59. Data processing
  60. Bremsstrahlung
  61. Spinner
  62. L series
  63. Beads
  64. Optical path
  65. Signal to noise
  66. Absorption edge
  67. Spectrum
  68. Vacancy
  69. Pellet
  70. Wavelength dispersive
  71. Optics
  72. Sequential spectrometers
  73. L-shell
  74. Compound
  75. Radiation
  76. X-ray tube
  77. Lecturer passes around samples
  78. Monochromator
  79. Matrix effect
  80. Collimeter
  81. MAC
  82. WD-XRF
  83. Sensitivity
  84. Calibration
  85. Multichannel analyzer
  86. Peak area
  87. Scattering
  88. We are at slide 22
  89. Vacuum
  90. Wavelength
  91. Bragg’s law
  92. Reference material