BindingenergySamplepreparationConcentrationPolarizationAccuracyWe get tolook up atablePowderBremsstrahlungCollimeterWavelengthdispersiveMatrixeffectReproducibilityNormalizationWe areat slide48AnalyzingcrystalChemometricAbsorptionedgeResolutionLoss ofignition(LOI)SignaltonoiseScatteringBeadsMalvernSamplepreparationReferencematerialPANanlyticalDispersionRadiationOpticalpathSensitivityCountspersecondBragg’slawTable topinstrumentThere is aspellingmistake onthe slideQuantitativeanalysisScatteringWe get todo anexperimentSi-PINSequentialXRFSomeonesneezesLseriesWe areat slide22QualitativeanalysisCupAugerSequentialspectrometersTin(Sn)WD-XRFM-shellMultichannelanalyzerComptonPpmDetectorMonochromatorSpecimenPelletLimit ofQuantitationSequentialXRFWavelengthSomeonesneezesCompoundSpectrumCalibrationLecturerpassesaroundsamplesSpectrometerSignaltonoiseVacuumSpectrallineX-rayLimit ofDetectionPeakareaWe get todo acalculationSensitivityStandarddeviationRayleighRhodium(Rh)DiffractioncrystalAnalysisX-raytubeMetalSi-PINAbsorptionDataprocessingSiegbahnnotationSpinnerL-shellSequentialspectrometersSiegbahnnotationMACVacancyMoseley’slawOpticsBindingenergySamplepreparationConcentrationPolarizationAccuracyWe get tolook up atablePowderBremsstrahlungCollimeterWavelengthdispersiveMatrixeffectReproducibilityNormalizationWe areat slide48AnalyzingcrystalChemometricAbsorptionedgeResolutionLoss ofignition(LOI)SignaltonoiseScatteringBeadsMalvernSamplepreparationReferencematerialPANanlyticalDispersionRadiationOpticalpathSensitivityCountspersecondBragg’slawTable topinstrumentThere is aspellingmistake onthe slideQuantitativeanalysisScatteringWe get todo anexperimentSi-PINSequentialXRFSomeonesneezesLseriesWe areat slide22QualitativeanalysisCupAugerSequentialspectrometersTin(Sn)WD-XRFM-shellMultichannelanalyzerComptonPpmDetectorMonochromatorSpecimenPelletLimit ofQuantitationSequentialXRFWavelengthSomeonesneezesCompoundSpectrumCalibrationLecturerpassesaroundsamplesSpectrometerSignaltonoiseVacuumSpectrallineX-rayLimit ofDetectionPeakareaWe get todo acalculationSensitivityStandarddeviationRayleighRhodium(Rh)DiffractioncrystalAnalysisX-raytubeMetalSi-PINAbsorptionDataprocessingSiegbahnnotationSpinnerL-shellSequentialspectrometersSiegbahnnotationMACVacancyMoseley’slawOptics

Malvern PANalytical - Call List

(Print) Use this randomly generated list as your call list when playing the game. There is no need to say the BINGO column name. Place some kind of mark (like an X, a checkmark, a dot, tally mark, etc) on each cell as you announce it, to keep track. You can also cut out each item, place them in a bag and pull words from the bag.


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  1. Binding energy
  2. Sample preparation
  3. Concentration
  4. Polarization
  5. Accuracy
  6. We get to look up a table
  7. Powder
  8. Bremsstrahlung
  9. Collimeter
  10. Wavelength dispersive
  11. Matrix effect
  12. Reproducibility
  13. Normalization
  14. We are at slide 48
  15. Analyzing crystal
  16. Chemometric
  17. Absorption edge
  18. Resolution
  19. Loss of ignition (LOI)
  20. Signal to noise
  21. Scattering
  22. Beads
  23. Malvern
  24. Sample preparation
  25. Reference material
  26. PANanlytical
  27. Dispersion
  28. Radiation
  29. Optical path
  30. Sensitivity
  31. Counts per second
  32. Bragg’s law
  33. Table top instrument
  34. There is a spelling mistake on the slide
  35. Quantitative analysis
  36. Scattering
  37. We get to do an experiment
  38. Si-PIN
  39. Sequential XRF
  40. Someone sneezes
  41. L series
  42. We are at slide 22
  43. Qualitative analysis
  44. Cup
  45. Auger
  46. Sequential spectrometers
  47. Tin (Sn)
  48. WD-XRF
  49. M-shell
  50. Multichannel analyzer
  51. Compton
  52. Ppm
  53. Detector
  54. Monochromator
  55. Specimen
  56. Pellet
  57. Limit of Quantitation
  58. Sequential XRF
  59. Wavelength
  60. Someone sneezes
  61. Compound
  62. Spectrum
  63. Calibration
  64. Lecturer passes around samples
  65. Spectrometer
  66. Signal to noise
  67. Vacuum
  68. Spectral line
  69. X-ray
  70. Limit of Detection
  71. Peak area
  72. We get to do a calculation
  73. Sensitivity
  74. Standard deviation
  75. Rayleigh
  76. Rhodium (Rh)
  77. Diffraction crystal
  78. Analysis
  79. X-ray tube
  80. Metal
  81. Si-PIN
  82. Absorption
  83. Data processing
  84. Siegbahn notation
  85. Spinner
  86. L-shell
  87. Sequential spectrometers
  88. Siegbahn notation
  89. MAC
  90. Vacancy
  91. Moseley’s law
  92. Optics