MACMultichannelanalyzerCompoundAnalysisMalvernQuantitativeanalysisReproducibilityK-alphaGammaraysDataprocessingIron(Fe)PpmElectronPelletAbsorptionLecturerpassesaroundsamplesGadolinium(Gd)OpticalpathLoss ofignition(LOI)BeadsKseriesSensitivitySomeonesneezesMoseley’slawSignaltonoiseNormalizationM-shellInfinitethicknessLseriesSpinnerRayleighSpectrallineFusionOpticsED-XRFSpectrumHomogeneousSequentialspectrometersCollimeterGraphitecrystalDiffractioncrystalStandarddeviationSequentialXRFElementalanalysisScatteringSamplepreparationGaussianRadiationBindingenergySpecimenBremsstrahlungEnergydispersiveSi-PINPolarizationAnalyzingcrystalBragg’slawSiegbahnnotationTable topinstrumentIonizationenergyGold(Au)QualitativeanalysisChemometricGoniometerEnhancementeffectReferencematerialMatrixeffectL-shellLimit ofQuantitationRhodium(Rh)AccuracyFluorescenceAugerMonochromatorConcentrationInnerelectronCupResolutionDetectorHeavyelementCalibrationEnhancementSpectrometerMetalCountspersecondAbsorptionedgeEmissionPANanlyticalGrindingElectronDispersionFirstorderreflectionComptonPeakareaPowderLimit ofDetectionMACMultichannelanalyzerCompoundAnalysisMalvernQuantitativeanalysisReproducibilityK-alphaGammaraysDataprocessingIron(Fe)PpmElectronPelletAbsorptionLecturerpassesaroundsamplesGadolinium(Gd)OpticalpathLoss ofignition(LOI)BeadsKseriesSensitivitySomeonesneezesMoseley’slawSignaltonoiseNormalizationM-shellInfinitethicknessLseriesSpinnerRayleighSpectrallineFusionOpticsED-XRFSpectrumHomogeneousSequentialspectrometersCollimeterGraphitecrystalDiffractioncrystalStandarddeviationSequentialXRFElementalanalysisScatteringSamplepreparationGaussianRadiationBindingenergySpecimenBremsstrahlungEnergydispersiveSi-PINPolarizationAnalyzingcrystalBragg’slawSiegbahnnotationTable topinstrumentIonizationenergyGold(Au)QualitativeanalysisChemometricGoniometerEnhancementeffectReferencematerialMatrixeffectL-shellLimit ofQuantitationRhodium(Rh)AccuracyFluorescenceAugerMonochromatorConcentrationInnerelectronCupResolutionDetectorHeavyelementCalibrationEnhancementSpectrometerMetalCountspersecondAbsorptionedgeEmissionPANanlyticalGrindingElectronDispersionFirstorderreflectionComptonPeakareaPowderLimit ofDetection

Malvern PANalytical - Call List

(Print) Use this randomly generated list as your call list when playing the game. There is no need to say the BINGO column name. Place some kind of mark (like an X, a checkmark, a dot, tally mark, etc) on each cell as you announce it, to keep track. You can also cut out each item, place them in a bag and pull words from the bag.


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  1. MAC
  2. Multichannel analyzer
  3. Compound
  4. Analysis
  5. Malvern
  6. Quantitative analysis
  7. Reproducibility
  8. K-alpha
  9. Gamma rays
  10. Data processing
  11. Iron (Fe)
  12. Ppm
  13. Electron
  14. Pellet
  15. Absorption
  16. Lecturer passes around samples
  17. Gadolinium (Gd)
  18. Optical path
  19. Loss of ignition (LOI)
  20. Beads
  21. K series
  22. Sensitivity
  23. Someone sneezes
  24. Moseley’s law
  25. Signal to noise
  26. Normalization
  27. M-shell
  28. Infinite thickness
  29. L series
  30. Spinner
  31. Rayleigh
  32. Spectral line
  33. Fusion
  34. Optics
  35. ED-XRF
  36. Spectrum
  37. Homogeneous
  38. Sequential spectrometers
  39. Collimeter
  40. Graphite crystal
  41. Diffraction crystal
  42. Standard deviation
  43. Sequential XRF
  44. Elemental analysis
  45. Scattering
  46. Sample preparation
  47. Gaussian
  48. Radiation
  49. Binding energy
  50. Specimen
  51. Bremsstrahlung
  52. Energy dispersive
  53. Si-PIN
  54. Polarization
  55. Analyzing crystal
  56. Bragg’s law
  57. Siegbahn notation
  58. Table top instrument
  59. Ionization energy
  60. Gold (Au)
  61. Qualitative analysis
  62. Chemometric
  63. Goniometer
  64. Enhancement effect
  65. Reference material
  66. Matrix effect
  67. L-shell
  68. Limit of Quantitation
  69. Rhodium (Rh)
  70. Accuracy
  71. Fluorescence
  72. Auger
  73. Monochromator
  74. Concentration
  75. Inner electron
  76. Cup
  77. Resolution
  78. Detector
  79. Heavy element
  80. Calibration
  81. Enhancement
  82. Spectrometer
  83. Metal
  84. Counts per second
  85. Absorption edge
  86. Emission
  87. PANanlytical
  88. Grinding
  89. Electron
  90. Dispersion
  91. First order reflection
  92. Compton
  93. Peak area
  94. Powder
  95. Limit of Detection