Limit ofQuantitationScatteringQualitativeanalysisDataprocessingEnergydispersiveElectronDetectorNormalizationGadolinium(Gd)Rhodium(Rh)IonizationenergySpectrallineMoseley’slawMonochromatorSpecimenGammaraysGrindingInnerelectronPANanlyticalAbsorptionQuantitativeanalysisRadiationFusionElementalanalysisDiffractioncrystalSpectrumConcentrationMultichannelanalyzerL-shellInfinitethicknessGoniometerEmissionAnalyzingcrystalCompoundAugerReproducibilityEnhancementeffectPeakareaHomogeneousBremsstrahlungDispersionCupKseriesAbsorptionedgeED-XRFGold(Au)OpticalpathSignaltonoisePelletLseriesPpmIron(Fe)BeadsMalvernRayleighSpinnerM-shellCollimeterSpectrometerBindingenergySensitivityComptonReferencematerialFluorescenceCountspersecondSequentialspectrometersCalibrationMACGaussianSamplepreparationAccuracyAnalysisLimit ofDetectionBragg’slawResolutionElectronSomeonesneezesFirstorderreflectionMatrixeffectLecturerpassesaroundsamplesOpticsGraphitecrystalPowderPolarizationLoss ofignition(LOI)SiegbahnnotationTable topinstrumentEnhancementStandarddeviationSi-PINK-alphaMetalChemometricSequentialXRFHeavyelementLimit ofQuantitationScatteringQualitativeanalysisDataprocessingEnergydispersiveElectronDetectorNormalizationGadolinium(Gd)Rhodium(Rh)IonizationenergySpectrallineMoseley’slawMonochromatorSpecimenGammaraysGrindingInnerelectronPANanlyticalAbsorptionQuantitativeanalysisRadiationFusionElementalanalysisDiffractioncrystalSpectrumConcentrationMultichannelanalyzerL-shellInfinitethicknessGoniometerEmissionAnalyzingcrystalCompoundAugerReproducibilityEnhancementeffectPeakareaHomogeneousBremsstrahlungDispersionCupKseriesAbsorptionedgeED-XRFGold(Au)OpticalpathSignaltonoisePelletLseriesPpmIron(Fe)BeadsMalvernRayleighSpinnerM-shellCollimeterSpectrometerBindingenergySensitivityComptonReferencematerialFluorescenceCountspersecondSequentialspectrometersCalibrationMACGaussianSamplepreparationAccuracyAnalysisLimit ofDetectionBragg’slawResolutionElectronSomeonesneezesFirstorderreflectionMatrixeffectLecturerpassesaroundsamplesOpticsGraphitecrystalPowderPolarizationLoss ofignition(LOI)SiegbahnnotationTable topinstrumentEnhancementStandarddeviationSi-PINK-alphaMetalChemometricSequentialXRFHeavyelement

Malvern PANalytical - Call List

(Print) Use this randomly generated list as your call list when playing the game. There is no need to say the BINGO column name. Place some kind of mark (like an X, a checkmark, a dot, tally mark, etc) on each cell as you announce it, to keep track. You can also cut out each item, place them in a bag and pull words from the bag.


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  1. Limit of Quantitation
  2. Scattering
  3. Qualitative analysis
  4. Data processing
  5. Energy dispersive
  6. Electron
  7. Detector
  8. Normalization
  9. Gadolinium (Gd)
  10. Rhodium (Rh)
  11. Ionization energy
  12. Spectral line
  13. Moseley’s law
  14. Monochromator
  15. Specimen
  16. Gamma rays
  17. Grinding
  18. Inner electron
  19. PANanlytical
  20. Absorption
  21. Quantitative analysis
  22. Radiation
  23. Fusion
  24. Elemental analysis
  25. Diffraction crystal
  26. Spectrum
  27. Concentration
  28. Multichannel analyzer
  29. L-shell
  30. Infinite thickness
  31. Goniometer
  32. Emission
  33. Analyzing crystal
  34. Compound
  35. Auger
  36. Reproducibility
  37. Enhancement effect
  38. Peak area
  39. Homogeneous
  40. Bremsstrahlung
  41. Dispersion
  42. Cup
  43. K series
  44. Absorption edge
  45. ED-XRF
  46. Gold (Au)
  47. Optical path
  48. Signal to noise
  49. Pellet
  50. L series
  51. Ppm
  52. Iron (Fe)
  53. Beads
  54. Malvern
  55. Rayleigh
  56. Spinner
  57. M-shell
  58. Collimeter
  59. Spectrometer
  60. Binding energy
  61. Sensitivity
  62. Compton
  63. Reference material
  64. Fluorescence
  65. Counts per second
  66. Sequential spectrometers
  67. Calibration
  68. MAC
  69. Gaussian
  70. Sample preparation
  71. Accuracy
  72. Analysis
  73. Limit of Detection
  74. Bragg’s law
  75. Resolution
  76. Electron
  77. Someone sneezes
  78. First order reflection
  79. Matrix effect
  80. Lecturer passes around samples
  81. Optics
  82. Graphite crystal
  83. Powder
  84. Polarization
  85. Loss of ignition (LOI)
  86. Siegbahn notation
  87. Table top instrument
  88. Enhancement
  89. Standard deviation
  90. Si-PIN
  91. K-alpha
  92. Metal
  93. Chemometric
  94. Sequential XRF
  95. Heavy element