QuantitativeanalysisRayleighSiegbahnnotationSpinnerPANanlyticalSpectrallineIron(Fe)IonizationenergyAnalysisPpmEnhancementeffectM-shellAbsorptionedgeSpectrometerOpticsSomeonesneezesAnalyzingcrystalGaussianInnerelectronMultichannelanalyzerAbsorptionDetectorGoniometerCollimeterComptonSi-PINLecturerpassesaroundsamplesLseriesBindingenergyFluorescenceMetalElectronElectronED-XRFGrindingAccuracySensitivitySequentialXRFReferencematerialAugerDataprocessingSignaltonoiseHomogeneousOpticalpathGadolinium(Gd)Gold(Au)ChemometricPelletBremsstrahlungPowderResolutionHeavyelementFirstorderreflectionCompoundPolarizationScatteringCalibrationRhodium(Rh)NormalizationKseriesDispersionL-shellSpectrumGammaraysInfinitethicknessQualitativeanalysisRadiationK-alphaMalvernEnergydispersiveLoss ofignition(LOI)ReproducibilityLimit ofQuantitationLimit ofDetectionEnhancementSamplepreparationBeadsConcentrationEmissionTable topinstrumentMonochromatorCupMatrixeffectMoseley’slawBragg’slawCountspersecondSequentialspectrometersSpecimenStandarddeviationFusionMACDiffractioncrystalPeakareaGraphitecrystalElementalanalysisQuantitativeanalysisRayleighSiegbahnnotationSpinnerPANanlyticalSpectrallineIron(Fe)IonizationenergyAnalysisPpmEnhancementeffectM-shellAbsorptionedgeSpectrometerOpticsSomeonesneezesAnalyzingcrystalGaussianInnerelectronMultichannelanalyzerAbsorptionDetectorGoniometerCollimeterComptonSi-PINLecturerpassesaroundsamplesLseriesBindingenergyFluorescenceMetalElectronElectronED-XRFGrindingAccuracySensitivitySequentialXRFReferencematerialAugerDataprocessingSignaltonoiseHomogeneousOpticalpathGadolinium(Gd)Gold(Au)ChemometricPelletBremsstrahlungPowderResolutionHeavyelementFirstorderreflectionCompoundPolarizationScatteringCalibrationRhodium(Rh)NormalizationKseriesDispersionL-shellSpectrumGammaraysInfinitethicknessQualitativeanalysisRadiationK-alphaMalvernEnergydispersiveLoss ofignition(LOI)ReproducibilityLimit ofQuantitationLimit ofDetectionEnhancementSamplepreparationBeadsConcentrationEmissionTable topinstrumentMonochromatorCupMatrixeffectMoseley’slawBragg’slawCountspersecondSequentialspectrometersSpecimenStandarddeviationFusionMACDiffractioncrystalPeakareaGraphitecrystalElementalanalysis

Malvern PANalytical - Call List

(Print) Use this randomly generated list as your call list when playing the game. There is no need to say the BINGO column name. Place some kind of mark (like an X, a checkmark, a dot, tally mark, etc) on each cell as you announce it, to keep track. You can also cut out each item, place them in a bag and pull words from the bag.


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  1. Quantitative analysis
  2. Rayleigh
  3. Siegbahn notation
  4. Spinner
  5. PANanlytical
  6. Spectral line
  7. Iron (Fe)
  8. Ionization energy
  9. Analysis
  10. Ppm
  11. Enhancement effect
  12. M-shell
  13. Absorption edge
  14. Spectrometer
  15. Optics
  16. Someone sneezes
  17. Analyzing crystal
  18. Gaussian
  19. Inner electron
  20. Multichannel analyzer
  21. Absorption
  22. Detector
  23. Goniometer
  24. Collimeter
  25. Compton
  26. Si-PIN
  27. Lecturer passes around samples
  28. L series
  29. Binding energy
  30. Fluorescence
  31. Metal
  32. Electron
  33. Electron
  34. ED-XRF
  35. Grinding
  36. Accuracy
  37. Sensitivity
  38. Sequential XRF
  39. Reference material
  40. Auger
  41. Data processing
  42. Signal to noise
  43. Homogeneous
  44. Optical path
  45. Gadolinium (Gd)
  46. Gold (Au)
  47. Chemometric
  48. Pellet
  49. Bremsstrahlung
  50. Powder
  51. Resolution
  52. Heavy element
  53. First order reflection
  54. Compound
  55. Polarization
  56. Scattering
  57. Calibration
  58. Rhodium (Rh)
  59. Normalization
  60. K series
  61. Dispersion
  62. L-shell
  63. Spectrum
  64. Gamma rays
  65. Infinite thickness
  66. Qualitative analysis
  67. Radiation
  68. K-alpha
  69. Malvern
  70. Energy dispersive
  71. Loss of ignition (LOI)
  72. Reproducibility
  73. Limit of Quantitation
  74. Limit of Detection
  75. Enhancement
  76. Sample preparation
  77. Beads
  78. Concentration
  79. Emission
  80. Table top instrument
  81. Monochromator
  82. Cup
  83. Matrix effect
  84. Moseley’s law
  85. Bragg’s law
  86. Counts per second
  87. Sequential spectrometers
  88. Specimen
  89. Standard deviation
  90. Fusion
  91. MAC
  92. Diffraction crystal
  93. Peak area
  94. Graphite crystal
  95. Elemental analysis