IonizationenergyLimit ofDetectionGaussianMACQualitativeanalysisEnhancementeffectBeadsSpectrumFluorescenceAnalysisSignaltonoiseCalibrationLoss ofignition(LOI)AugerCupBragg’slawSiegbahnnotationHomogeneousK-alphaOpticalpathSamplepreparationChemometricStandarddeviationReproducibilityAnalyzingcrystalPowderSi-PINAbsorptionSequentialspectrometersMetalElectronDetectorED-XRFOpticsPelletDataprocessingBindingenergyQuantitativeanalysisDispersionGold(Au)Table topinstrumentBremsstrahlungEnergydispersiveElectronComptonNormalizationSpinnerDiffractioncrystalLimit ofQuantitationPANanlyticalCompoundIron(Fe)AccuracyReferencematerialPeakareaMatrixeffectHeavyelementMalvernCountspersecondMonochromatorGrindingSpecimenEnhancementRhodium(Rh)SpectrallineGadolinium(Gd)MultichannelanalyzerInnerelectronInfinitethicknessAbsorptionedgeCollimeterMoseley’slawGammaraysLseriesSensitivityRayleighConcentrationPpmPolarizationFusionL-shellGoniometerKseriesFirstorderreflectionEmissionLecturerpassesaroundsamplesSequentialXRFSomeonesneezesElementalanalysisResolutionRadiationScatteringM-shellGraphitecrystalSpectrometerIonizationenergyLimit ofDetectionGaussianMACQualitativeanalysisEnhancementeffectBeadsSpectrumFluorescenceAnalysisSignaltonoiseCalibrationLoss ofignition(LOI)AugerCupBragg’slawSiegbahnnotationHomogeneousK-alphaOpticalpathSamplepreparationChemometricStandarddeviationReproducibilityAnalyzingcrystalPowderSi-PINAbsorptionSequentialspectrometersMetalElectronDetectorED-XRFOpticsPelletDataprocessingBindingenergyQuantitativeanalysisDispersionGold(Au)Table topinstrumentBremsstrahlungEnergydispersiveElectronComptonNormalizationSpinnerDiffractioncrystalLimit ofQuantitationPANanlyticalCompoundIron(Fe)AccuracyReferencematerialPeakareaMatrixeffectHeavyelementMalvernCountspersecondMonochromatorGrindingSpecimenEnhancementRhodium(Rh)SpectrallineGadolinium(Gd)MultichannelanalyzerInnerelectronInfinitethicknessAbsorptionedgeCollimeterMoseley’slawGammaraysLseriesSensitivityRayleighConcentrationPpmPolarizationFusionL-shellGoniometerKseriesFirstorderreflectionEmissionLecturerpassesaroundsamplesSequentialXRFSomeonesneezesElementalanalysisResolutionRadiationScatteringM-shellGraphitecrystalSpectrometer

Malvern PANalytical - Call List

(Print) Use this randomly generated list as your call list when playing the game. There is no need to say the BINGO column name. Place some kind of mark (like an X, a checkmark, a dot, tally mark, etc) on each cell as you announce it, to keep track. You can also cut out each item, place them in a bag and pull words from the bag.


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  1. Ionization energy
  2. Limit of Detection
  3. Gaussian
  4. MAC
  5. Qualitative analysis
  6. Enhancement effect
  7. Beads
  8. Spectrum
  9. Fluorescence
  10. Analysis
  11. Signal to noise
  12. Calibration
  13. Loss of ignition (LOI)
  14. Auger
  15. Cup
  16. Bragg’s law
  17. Siegbahn notation
  18. Homogeneous
  19. K-alpha
  20. Optical path
  21. Sample preparation
  22. Chemometric
  23. Standard deviation
  24. Reproducibility
  25. Analyzing crystal
  26. Powder
  27. Si-PIN
  28. Absorption
  29. Sequential spectrometers
  30. Metal
  31. Electron
  32. Detector
  33. ED-XRF
  34. Optics
  35. Pellet
  36. Data processing
  37. Binding energy
  38. Quantitative analysis
  39. Dispersion
  40. Gold (Au)
  41. Table top instrument
  42. Bremsstrahlung
  43. Energy dispersive
  44. Electron
  45. Compton
  46. Normalization
  47. Spinner
  48. Diffraction crystal
  49. Limit of Quantitation
  50. PANanlytical
  51. Compound
  52. Iron (Fe)
  53. Accuracy
  54. Reference material
  55. Peak area
  56. Matrix effect
  57. Heavy element
  58. Malvern
  59. Counts per second
  60. Monochromator
  61. Grinding
  62. Specimen
  63. Enhancement
  64. Rhodium (Rh)
  65. Spectral line
  66. Gadolinium (Gd)
  67. Multichannel analyzer
  68. Inner electron
  69. Infinite thickness
  70. Absorption edge
  71. Collimeter
  72. Moseley’s law
  73. Gamma rays
  74. L series
  75. Sensitivity
  76. Rayleigh
  77. Concentration
  78. Ppm
  79. Polarization
  80. Fusion
  81. L-shell
  82. Goniometer
  83. K series
  84. First order reflection
  85. Emission
  86. Lecturer passes around samples
  87. Sequential XRF
  88. Someone sneezes
  89. Elemental analysis
  90. Resolution
  91. Radiation
  92. Scattering
  93. M-shell
  94. Graphite crystal
  95. Spectrometer